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半导体cp测试简易处理方案
最近,有研发的朋友遇到了一个难题:在晶圆做完cp测试后,在切割编带时,需要cp测试的map作为编带的依据,即符合cp测试标准的就编带,不符合cp测试标准的就留在切割完的晶圆上不编带。但是,cp标准是在probe上设定好的,导出的map图也都是根据probe上设定的 ...
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